LINX Test Systems

 

Realtime Wafer Map ::

The LINX Realtime Wafer Map is an external, standalone, realtime wafer display for wafer processing equipment including all standard wafer probers such as TSK, Semics, EG and Tel. The Realtime Wafer Map display can be accessed from any standard browser making the information available anywhere on the network.

     Key Features
  • Remotely view and monitor wafer testing in real time
  • Binning and yield displays
  • Tester/Prober independent. No software installed.
  • Standardized interface across all platforms
  • Historical wafer display
  • Automatic wafer reports
  • LAMP architecture (linux, apache, mysql, perl)

     Benefits
waferMapScreen01
  • Quickly identify probe failures
  • Visualize throughput
  • Monitor probe operations from remote locations

Individual Wafer Map

Wafer Map with Reprobe Recovery

Yield Binning Thruput Display

waferMapFirstPass_button01

waferMapReprobe_button01

wmapDevicePerBin_button01

  • Configurable reporting
  • Product line reports
  • Date reports
  • Shift reports
  • Process comparison over time
  • Analyze operational losses
  • Drill down to detail lot view
  • Identify test/index time variations
  • Lot/device execution timeline
  • Site to site yield tracking
  • Binning, yield, UPH
  • Hard and soft jam

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TEL :: 617-278-6511     FAX :: 617-278-6514     EMAIL :: info@linxtest.com

LINX Test Systems, Inc. All Rights Reserved :: All other brand and product names are trademarks or registered trademarks of their respective holder.